Author Info
Name
Affiliation
Papers
AV-RON, MOSHE
IBM Data Systems Division laboratory, East Fishkill, New York
1
Collaborators
Citations 
PageRank 
2
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Defect-Related Breakdown and Conduction in SiO200.341980