Name
Title | ||
|---|---|---|
SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System |
Abstract | ||
|---|---|---|
In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can beutilized in education process in order to illustrate relation between design and diagnostic parameters of embedded system. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/ECBS.2006.65 | ECBS |
Keywords | Field | DocType |
education process,interactive tool,scan-based dft principles,testability technique principle,diagnostic parameter,embedded system,design for testability,embedded computing,embedded systems | Design for testing,Systems engineering,Computer science,Electronic engineering education,Electronics engineering education,Embedded system | Conference |
ISBN | Citations | PageRank |
0-7695-2546-6 | 0 | 0.34 |
References | Authors | |
2 | 2 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Josef Strnadel | 1 | 39 | 9.21 |
| Zdenek Kotasek | 2 | 123 | 14.20 |