Name
Abstract | ||
|---|---|---|
The authors describe a novel tool that dramatically extends the usability of electron-beam probers for long duty cycle applications. The tool is modeled on a conventional logic analyzer (primarily for ease-of-use reasons). The tool comprises both hardware and software, and utilizes new sampling strategies which exploit fully the available detector bandwidth, thereby reducing dramatically typical signal acquisition times. The tool also provides, under certain circumstances, the ability to acquire intermittent signals. The proposed approach improves typical signal acquisition times by two orders of magnitude |
Year | DOI | Venue |
|---|---|---|
1989 | 10.1109/TEST.1989.82384 | Washington, DC |
Keywords | Field | DocType |
VLSI,automatic test equipment,automatic testing,data acquisition,electron beam applications,integrated circuit testing,logic analysers,logic testing,ATE,IC testing,VLSI,e-beam prober,electron-beam probers,intermittent signals,logic analyzer tool,sampling,signal acquisition times | Duty cycle,Computer science,Automatic test equipment,Data acquisition,Logic analyzer,Real-time computing,Electronic engineering,Bandwidth (signal processing),Software,Very-large-scale integration,Detector | Conference |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Christopher G. Talbot | 1 | 0 | 0.34 |
| Suresh Rajan | 2 | 0 | 0.34 |