Author Info
Name
Affiliation
Papers
H. NIELEN
Corporate Reliability DepartmentInfineon Technologies AGNeubibergGermany
1
Collaborators
Citations 
PageRank 
5
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Fast wafer level reliability monitoring as a tool to achieve automotive quality for a wafer process.00.342016