Name
Title | ||
|---|---|---|
Future Trends in Test of Electronic Circuits With Implications tor Entry Level Test Professionals |
Year | Venue | Field |
|---|---|---|
1985 | ITC | Systems engineering,Computer science,Operations research,Electronic engineering,Entry Level,Electronic circuit |
DocType | Citations | PageRank |
Conference | 0 | 0.34 |
References | Authors | |
0 | 2 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Albert B. Grubbs Jr. | 1 | 0 | 0.34 |
| Glenn Neland | 2 | 0 | 0.34 |