Abstract | ||
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A systematic design of the pipelined analog-to-digital converter with radix<2 is described. A 50MHz, 3.3V, 10-bit pipelined analog-to-digital converter has been implemented in a 0.25-μm CMOS technology using radix<2 architecture. It achieves more than 54dB signal-to-noise plus distortion ratio in Nyquist signal sampling at 3.0V (10% lower than the 3.3V nominal value) over −40 to +120°C temperature range with a full-scale sinusoidal input. The IM3 of the converter, which is an important parameter for the OFDM based systems, is less than −64dB. Non-linearity is reduced through digital self-calibration and correction. The digital calibration procedure takes less than 24μS and can be done either on power up or intermittently. The layout area is 1.8mm×1.2mm. The converter consumes 100mA out of a 3.3V supply including the reference circuitry, analog cells, and all digital blocks at full-scale Nyquist sampling speed. |
Year | DOI | Venue |
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2004 | 10.1016/j.mejo.2004.05.003 | Microelectronics Journal |
Keywords | Field | DocType |
Analog-to-digital converter,CMOS analog integrated circuits,Switched capacitor,Digital bit weight self-calibration,Radix<2,Third order inter-modulation harmonic | SINADR,Total harmonic distortion,CMOS,Radix,Electronic engineering,Analog-to-digital converter,Switched capacitor,Nyquist stability criterion,Engineering,Electrical engineering,Real versus nominal value | Journal |
Volume | Issue | ISSN |
35 | 9 | 0026-2692 |
Citations | PageRank | References |
1 | 0.35 | 8 |
Authors | ||
2 |
Name | Order | Citations | PageRank |
---|---|---|---|
Babak Nejati | 1 | 1 | 1.03 |
Omid Shoaei | 2 | 134 | 40.66 |