Name
Year | Venue | Field |
|---|---|---|
2012 | ESANN | Pattern recognition,Computer science,Resistive touchscreen,Voltage,Neuromorphic engineering,Electronic engineering,CMOS,Robustness (computer science),Artificial intelligence |
DocType | Citations | PageRank |
Conference | 0 | 0.34 |
References | Authors | |
3 | 2 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Arne Heittmann | 1 | 24 | 5.94 |
| Tobias G. Noll | 2 | 199 | 37.51 |